Author: Frohnhoff S. Arens-Fischer R. Heinrich T. Fricke J. Arntzen M. Theiss W.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.255, Iss.1, 1995-01, pp. : 115-118
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterisation of freeze-dried porous silicon
By Amato G. Brunetto N. Parisini A.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :
Optical characterization of porous silicon films and multilayer filters
Applied Physics A, Vol. 79, Iss. 8, 2004-12 ,pp. :
Characterization of porous silicon by means of photoacoustic spectroscopy
Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. :
In situ photoluminescence characterization of porous silicon formation
By Chi N. Phillips D.L. Chan K.-Y.
Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. :