Author: Ohmukai M. Tsutsumi Y.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.302, Iss.1, 1997-06, pp. : 51-53
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterization of supercritically dried porous silicon
By Frohnhoff S. Arens-Fischer R. Heinrich T. Fricke J. Arntzen M. Theiss W.
Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. :
Optical characterization of porous silicon films and multilayer filters
Applied Physics A, Vol. 79, Iss. 8, 2004-12 ,pp. :
In situ photoluminescence characterization of porous silicon formation
By Chi N. Phillips D.L. Chan K.-Y.
Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. :