Fourier transform IR monitoring of porous silicon passivation during post-treatments such as anodic oxidation and contact with organic solvents

Author： Hory M.A.   Herino R.   Ligeon M.   Muller F.   Gaspard F.   Mihalcescu I.   Vial J.C.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.255, Iss.1, 1995-01, pp. : 200-203

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