Characterization of porous silicon-on-insulator films prepared by anodic oxidation

By Lee C.H.   Yeh C.C.   Hwang H.L.   Hsu K.Y.J.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 147-150

Elsevier

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Erratum: Determination of the thickness and optical constants of thin films from transmission spectra (Thin Solid Films (1996) 286 (vi))

By Kubinyi M.   Benko N.   Grofcsik A.   Jones W.J.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 333-333

Elsevier

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Compositional characterization of silicon nitride thin films prepared by RF-sputtering

By Vila M.   Martn-Gago J.A.   Munoz-Martn A.   Prieto C.   Miranzo P.   Osendi M.I.   Garca-Lopez J.   Respaldiza M.A.  

Vacuum, Vol. 67, Iss. 3, 2002-09 ,pp. : 513-518

Elsevier

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Erratum: ''Yttria-stabilised zirconia thin films grown by reactive r.f. magnetron sputtering'' (Thin Solid Films, 287 (1996) 104-109))

By Haemers J.   Denul J.   De Roo N.   De Gryse R.   Tomaszewski H.  

Thin Solid Films, Vol. 306, Iss. 1, 1997-08 ,pp. : 178-178

Elsevier

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Erratum: ''Effect of normal load on microscale friction measurements'' (Thin Solid Films (1996) 278 (49-56))

By Bhushan B.   Kulkarni A.V.  

Thin Solid Films, Vol. 293, Iss. 1, 1997-01 ,pp. : 333-333

Elsevier

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