New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load

Author： Zheludeva S.I.   Kovalchuk M.V.   Novikova N.N.   Sosphenov A.N.   Malysheva N.E.   Salashenko N.N.   Akhsakhalyan A.D.   Platonov Y.Y.   Cernik R.I.   Collins S.P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.259, Iss.2, 1995-04, pp. : 131-138

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