Comparison of mechanical properties and microstructure of Al(1 wt.%Si) and Al(1 wt.%Si, 0.5 wt.%Cu) thin films

Author： Bader S.   Kalaugher E.M.   Arzt E.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.263, Iss.2, 1995-07, pp. : 175-184

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