1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy

Author： Michels A.   Meinen F.   Beckmann E.   Fuchs H.   Murdfield T.   Gohde W.   Fischer U.C.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.264, Iss.2, 1995-08, pp. : 172-175

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of electronic materials and devices by scanning near-field microscopy

By Balk L.J.   Heiderhoff R.   Phang J.C.H.   Thomas Ch.  

Applied Physics A, Vol. 87, Iss. 3, 2007-06 ,pp. : 443-449

Springer Publishing Company

Access to resources Recommend Favorite

Optical processing by scanning near-field optical/atomic force microscopy

By Nakajima K.   Muramastu H.   Chiba N.   Ataka T.   Fujihira M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 327-330

Elsevier

Access to resources Recommend Favorite

Scanning near-field optic/atomic force microscopy in liquids

By Muramatsu H.   Chiba N.   Homma K.   Nakajima K.   Ataka T.   Ohta S.   Kusumi A.   Fujihira M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 335-338

Elsevier

Access to resources Recommend Favorite

Radiation coupling and image formation in scanning near-field optical microscopy

By Pohl D.W.   Hecht B.   Novotny L.   Heinzelmann H.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 161-167

Elsevier

Access to resources Recommend Favorite

Design and application of scanning near-field optical/atomic force microscopy

By Ataka T.   Muramatsu H.   Nakajima K.   Chiba N.   Homma K.   Fujihara M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 154-160

Elsevier

Access to resources Recommend Favorite