Optical processing by scanning near-field optical/atomic force microscopy

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Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 327-330

Elsevier

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Design and application of scanning near-field optical/atomic force microscopy

By Ataka T.   Muramatsu H.   Nakajima K.   Chiba N.   Homma K.   Fujihara M.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 154-160

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Nanoscale morphology of polyelectrolyte self-assembled films probed by scanning force and near-field scanning optical microscopy

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Thin Solid Films, Vol. 405, Iss. 1, 2002-02 ,pp. : 135-140

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The atomic force microscope as a near-field probe for ultrasound

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Resolution of an optical image of a scanning near-field optical/atomic force microscope as a function of sample-probe distance during synchronized irradiation

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Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 331-334

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