High-reliability interconnection formation by a two-step switching bias sputtering process

Author： Onuki J.   Nihei M.   Koizumi M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.266, Iss.2, 1995-10, pp. : 182-188

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Two-step growth of high quality diamond films

By Liao Y.   Chang C.   Li C.H.   Ye Z.Y.   Wang G.Z.   Fang R.C.  

Thin Solid Films, Vol. 368, Iss. 2, 2000-06 ,pp. : 303-306

Elsevier

Access to resources Recommend Favorite

The application of a two-step AI model to an automated pneumatic drilling process

By Sedano Javier  

International Journal of Computer Mathematics, Vol. 86, Iss. 10-11, 2009-10 ,pp. : 1769-1777

Taylor & Francis Ltd

Access to resources Recommend Favorite

Characterisation of POLICRYPS structures assembled through a two-step process

By            

Liquid Crystals, Vol. 41, Iss. 9, 2014-09 ,pp. : 1315-1322

Taylor & Francis Ltd

Access to resources Recommend Favorite

Xylose Isomerization with Zeolites in a Two‐Step Alcohol–Water Process

By  

CHEMSUSCHEM (ELECTRONIC) CHEMISTRY AND SUSTAINABILITY, ENERGY & MATERIALS, Vol. 8, Iss. 6, 2015-03 ,pp. : 1088-1094

John Wiley & Sons Inc

Access to resources Recommend Favorite

Investigation of a Two-Step Rotary Rim-Thickening Process of Disc-Like Blanks

By  

Materials Science Forum, Vol. 2018, Iss. 920, 2018-05 ,pp. : 89-94

Trans Tech Publications

Access to resources Recommend Favorite