Morphology of the InAlAs/InP interface in the MBE-grown heterostructures analysed by SIMS depth profiling

Author: Herman M.A.   Konarski P.   Kozhukhov A.V.   Obodnikov V.I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.267, Iss.1, 1995-10, pp. : 114-120

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Abstract