Reflection high-energy electron loss spectroscopy (RHEELS): a new approach in the investigation of epitaxial thin film growth by reflection high-energy electron diffraction (RHEED)

By Masek K.   Moroz V.   Matoln V.  

Vacuum, Vol. 71, Iss. 1, 2003-05 ,pp. : 59-64

Elsevier

Access to resources Recommend Favorite

The chemistry, structure, and resulting wear properties of magnetron-sputtered NbN thin films

By Havey K.S.   Walck S.D.   Zabinski J.S.  

Thin Solid Films, Vol. 303, Iss. 1, 1997-07 ,pp. : 238-245

Elsevier

Access to resources Recommend Favorite

Crystallographic characterization of sputter-deposited epitaxial Nb-Cu-Co and Nb-Cu-Permalloy multilayers using electron back-scatter diffraction patterns

By Loloee R.   Pratt W. P.   Crimp M. A.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 2, 2001-02 ,pp. : 261-273

Taylor & Francis Ltd

Access to resources Recommend Favorite

Structural studies of disordered carbons by high-energy X-ray diffraction

By Hawełek L.  

Philosophical Magazine, Vol. 87, Iss. 32, 2007-11 ,pp. : 4973-4986

Taylor & Francis Ltd

Access to resources Recommend Favorite

A comparative study on fretting wear-resistant properties of ion-plated TiN and magnetron-sputtered MoS 2 coatings

By Xu G.-z.   Zhou Z.   Liu J.  

Wear, Vol. 224, Iss. 2, 1999-02 ,pp. : 211-215

Elsevier

Access to resources Recommend Favorite