![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Lindquist C. Urban F.K. Lindquist C.S. Urban F.K.I.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.270, Iss.1, 1995-12, pp. : 399-405
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Scanning probe microscopy of organics, an update
By Frommer J.E.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Scanning probe microscopy of automotive anti-wear films
Wear, Vol. 212, Iss. 2, 1997-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Anisotropy in wear processes measured by scanning probe microscopy
By Schouterden K. Lairson B.M.
Thin Solid Films, Vol. 340, Iss. 1, 1999-02 ,pp. :