Author: Morita S. Fujisawa S. Kishi E. Ohta M. Ueyama H. Sugawara Y.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.273, Iss.1, 1996-02, pp. : 138-142
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Nanomechanical measurements on polymers using contact mode atomic force microscopy
Thin Solid Films, Vol. 339, Iss. 1, 1999-02 ,pp. :
Contact mechanics and friction of fractal surfaces probed by atomic force microscopy
By Buzio R. Boragno C. Valbusa U.
Wear, Vol. 254, Iss. 9, 2003-05 ,pp. :
Ferroelectret non-contact ultrasonic transducers
By Bovtun V. Döring J. Bartusch J. Beck U. Erhard A. Yakymenko Y.
Applied Physics A, Vol. 88, Iss. 4, 2007-09 ,pp. :