Contact and non-contact mode imaging by atomic force microscopy

Author: Morita S.   Fujisawa S.   Kishi E.   Ohta M.   Ueyama H.   Sugawara Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.273, Iss.1, 1996-02, pp. : 138-142

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract