Author: Bovtun V. Döring J. Bartusch J. Beck U. Erhard A. Yakymenko Y.
Publisher: Springer Publishing Company
ISSN: 0947-8396
Source: Applied Physics A, Vol.88, Iss.4, 2007-09, pp. : 737-743
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Contact and non-contact mode imaging by atomic force microscopy
By Morita S. Fujisawa S. Kishi E. Ohta M. Ueyama H. Sugawara Y.
Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. :
Non-contact measurement of conductivity during growth of metal ultrathin films
By Fahsold G. Priebe A. Magg N. Pucci A.
Thin Solid Films, Vol. 428, Iss. 1, 2003-03 ,pp. :
A Non-Contact Test Method on Local Mechanical Properties of Weld Joint
Materials Science Forum, Vol. 2016, Iss. 850, 2016-04 ,pp. :
Piezoelectric films for 100-MHz ultrasonic transducers
By Martin P.M. Good M.S. Johnston J.W. Posakony G.J. Bond L.J. Crawford S.L.
Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. :