Mossbauer characterization of FeN thin films prepared by reactive evaporation

Author： Vergnat M.   Bauer P.   Chatbi H.   Marchal G.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.275, Iss.1, 1996-04, pp. : 251-253

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Microstructural characterization of Fe-N thin films

By Zhan Q.   Yu R.   He L.L.   Li D.X.  

Thin Solid Films, Vol. 411, Iss. 2, 2002-05 ,pp. : 225-228

Elsevier

Access to resources Recommend Favorite

Characterization of AlN thin film prepared by reactive sputtering

By  

SURFACE AND INTERFACE ANALYSIS, Vol. 48, Iss. 10, 2016-10 ,pp. : 1029-1032

John Wiley & Sons Inc

Access to resources Recommend Favorite

Optical and structural properties of nanocrystalline copper oxide thin films prepared by activated reactive evaporation

By Balamurugan B.   Mehta B.R.  

Thin Solid Films, Vol. 396, Iss. 1, 2001-09 ,pp. : 90-96

Elsevier

Access to resources Recommend Favorite

Magnetic and Optical Properties of Fe-Doped SnO 2 Thin Films Prepared by Electron Beam Evaporation Technique

By Ghanaatshoar M.  

Journal of Superconductivity and Novel Magnetism, Vol. 26, Iss. 4, 2013-04 ,pp. : 995-999

Springer Publishing Company

Access to resources Recommend Favorite

Structural characterization of PbTiO 3 thin films prepared by ion beam induced CVD and evaporation of lead

By Gonzalez-Elipe A.R.   Leinen D.   Caballero A.   Fernandez A.   Espinos J.P.   Justo A.   Martin J.M.   Maurin-Perrier B.  

Thin Solid Films, Vol. 272, Iss. 1, 1996-01 ,pp. : 99-106

Elsevier

Access to resources Recommend Favorite