Surface structure characterization by photoelectron holography

Author: Zharnikov M.   Weinelt M.   Zebisch P.   Steinruck H.-P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.275, Iss.1, 1996-04, pp. : 266-269

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract