Studies with Ni/Ti multilayer films using X-ray photoelectron spectroscopy and neutron reflectometry: microscopic characterization of structure and chemical composition

Author： Vedpathak M.   Basu S.   Gokhale S.   Kulkarni S.K.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.335, Iss.1, 1998-11, pp. : 13-18

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