Profile analysis of thin film X-ray diffraction peaks

Author: Bimbault L.   Badawi K.F.   Goudeau P.   Durand N.   Branger V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.275, Iss.1, 1996-04, pp. : 40-43

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract