Author: Kovalev D. Chorin M.B. Diener J. Koch F. Kux A. Efros A.L. Rosen M. Gippius N.A. Tikhodeev S.G.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.276, Iss.1, 1996-04, pp. : 120-122
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electrochemistry and photoluminescence of porous amorphous silicon
By Wehrspohn R.B. Chazalviel J.-N. Ozanam F. Solomon I.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :
Stability of electroluminescence and photoluminescence of porous silicon
By Kozlowski F. Wiedenhofer A. Wagenseil W. Steiner P. Lang W.
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :
Resonantly excited photoluminescence in porous silicon
By Rosenbauer M. Leach D.H. Sendova-Vassileva M. Finkbeiner S. Stutzmann M.
Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. :
Raman scattering and luminescence polarization anisotropy in porous Si
By Guha S.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :
In-situ photoluminescence studies of porous silicon in liquids
By Ozanam F. Chazalviel J.-N. Wehrspohn R.B.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :