Bimodal size distribution in p - porous silicon studied by small angle X-ray scattering

Author: Binder M.   Edelmann T.   Metzger T.H.   Peisl J.   Mauckner G.   Goerigk G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.276, Iss.1, 1996-04, pp. : 65-68

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