Electromagnetic field resonance in thin amorphous films: a tool for non-destructive localization of thin marker layers by use of a standard X-ray tube

Author： Di Fonzo S.   Jark W.   Lagomarsino S.   Cedola A.   Muller B.R.   Pelka J.B.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.287, Iss.1, 1996-10, pp. : 288-292

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