X-ray photoelectron spectroscopy of highly conducting and amorphous osmium dioxide thin films

Author: Hayakawa Y.   Fukuzaki K.   Kohiki S.   Shibata Y.   Matsuo T.   Wagatsuma K.   Oku M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.347, Iss.1, 1999-06, pp. : 56-59

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Abstract