Epitaxial film crystallography by high-energy Auger and X-ray photoelectron diffraction

By Chambers Scott A.  

Advances In Physics, Vol. 40, Iss. 4, 1991-08 ,pp. : 357-415

Taylor & Francis Ltd

Access to resources Recommend Favorite

An X-ray diffraction study of epitaxial TiN/NbN superlattices

By Madan A.   Yashar P.   Shinn M.   Barnett S.A.  

Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. : 147-154

Elsevier

Access to resources Recommend Favorite

New X-ray diffraction method for materials science

By Swiatek Z.   Bonarski J.T.   Ciach R.   Kuznicki Z.T.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 16-19

Elsevier

Access to resources Recommend Favorite

Characterization of long-periodic layered structures by X-ray diffraction Part VI: Electron density distribution and chain orientation in a Langmuir-Blodgett film of cadmium stearate

By Sasanuma Y.   Nakahara H.  

Thin Solid Films, Vol. 261, Iss. 1, 1995-06 ,pp. : 280-286

Elsevier

Access to resources Recommend Favorite

Profile analysis of thin film X-ray diffraction peaks

By Bimbault L.   Badawi K.F.   Goudeau P.   Durand N.   Branger V.  

Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. : 40-43

Elsevier

Access to resources Recommend Favorite