Carbon and germanium distributions in Si 1-x-y Ge x C y layers epitaxially grown on Si(001) by RTCVD

Author: Guedj C.   Portier X.   Hairie A.   Bouchier D.   Piriou B.   Calvarin G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 129-132

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Abstract