Infrared spectroscopy of strained Si 1-y C y alloys (0 =< y =< 0.015) grown on silicon

Author: Pressel K.   Fischer G.G.   Zaumseil P.   Kim M.   Osten H.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 133-136

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Abstract