Computer simulation of percolated porous Si structure and its application to electrical conductivity simulation

Author： Yeh E.C.C.   Chiou M.S.   Hsu K.Y.J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.297, Iss.1, 1997-04, pp. : 88-91

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