Visual determination of thickness and porosity of porous silicon layers

Author: Lazarouk S.   Jaguiro P.   Katsouba S.   Maiello G.   La Monica S.   Masini G.   Proverbio E.   Ferrari A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.297, Iss.1, 1997-04, pp. : 97-101

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Abstract