Author: Liu J.-F. Wang S.-X. Yang K.-Z.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.298, Iss.1, 1997-04, pp. : 156-159
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterization of boron-doped tin oxide thin films
By Nasser S.A.
Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. :
Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry
Materials Science Forum, Vol. 2016, Iss. 851, 2016-05 ,pp. :