Author: Forcht K. Gombert A. Joerger R. Kohl M.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.302, Iss.1, 1997-06, pp. : 43-50
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterization of quasi-rugate filters using ellipsometric measurements
By Hrdina J. Tikhonravov A.V. Trubetskov M.K. Sobota J.
Thin Solid Films, Vol. 277, Iss. 1, 1996-05 ,pp. :
Ellipsometric analysis of polysilicon layers
By Gruska B.
Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. :