Incoherent superposition in ellipsometric measurements

By Forcht K.   Gombert A.   Joerger R.   Kohl M.  

Thin Solid Films, Vol. 302, Iss. 1, 1997-06 ,pp. : 43-50

Elsevier

Access to resources Recommend Favorite

In-situ ellipsometric characterization of the electrodeposition of metal films

By Hilfiker J.N.   Thompson D.W.   Hale J.S.   Woollam J.A.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 73-77

Elsevier

Access to resources Recommend Favorite

Synthesis and ellipsometric characterization of insulating low permittivity SiO 2 layers by remote-PECVD using radio-frequency glow discharge

By Dultsev F.N.   Solowjev A.P.  

Thin Solid Films, Vol. 419, Iss. 1, 2002-11 ,pp. : 27-32

Elsevier

Access to resources Recommend Favorite

A larger class than the Deák one for the coincidence of some notions of quasi-uniform completeness using pairs of filters

By Andrikopoulos A.  

Studia Scientiarum Mathematicarum Hungarica, Vol. 41, Iss. 4, 2004-10 ,pp. : 431-436

Akademiai Kiado

Access to resources Recommend Favorite

Ellipsometric characterization of an AISI 304 stainless steel protective coating

By Fuentes-Gallego J.J.   Blanco E.   Esquivias L.  

Thin Solid Films, Vol. 301, Iss. 1, 1997-06 ,pp. : 12-16

Elsevier

Access to resources Recommend Favorite