Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

Author： Houze F.   Newton P.   Guessab S.   Noel S.   Boyer L.   Lecayon G.   Viel P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.303, Iss.1, 1997-07, pp. : 200-206

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