Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy

Author： Fukuma T.   Kobayashi K.   Horiuchi T.   Yamada H.   Matsushige K.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.397, Iss.1, 2001-10, pp. : 133-137

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Measuring the thermal properties of photoresist thin films using atomic force microscopy

By Kawai A.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 308-311

Elsevier

Access to resources Recommend Favorite

Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy

By Renault P.O.   Villain P.   Coupeau C.   Goudeau P.   Badawi K.F.  

Thin Solid Films, Vol. 424, Iss. 2, 2003-01 ,pp. : 267-273

Elsevier

Access to resources Recommend Favorite

Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

By Houze F.   Newton P.   Guessab S.   Noel S.   Boyer L.   Lecayon G.   Viel P.  

Thin Solid Films, Vol. 303, Iss. 1, 1997-07 ,pp. : 200-206

Elsevier

Access to resources Recommend Favorite

The microstructure of thin films observed using atomic force microscopy

By Westra K.L.   Thomson D.J.  

Thin Solid Films, Vol. 257, Iss. 1, 1995-02 ,pp. : 15-21

Elsevier

Access to resources Recommend Favorite

Atomic force microscopy of in situ deformed nickel thin films

By Coupeau C.   Naud J.F.   Cleymand F.   Goudeau P.   Grilhe J.  

Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 194-200

Elsevier

Access to resources Recommend Favorite