Determination of the thickness and optical constants of thin films from transmission spectra

By Kubinyi M.   Benko N.   Grofcsik A.   Jones W.J.  

Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. : 164-169

Elsevier

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Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

By Franquet A.   De Laet J.   Schram T.   Terryn H.   Subramanian V.   van Ooij W.J.   Vereecken J.  

Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. : 37-45

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Determination of the thickness and optical constants of amorphous Ge-Se-Bi thin films

By Dahshan A.  

Philosophical Magazine, Vol. 89, Iss. 12, 2009-04 ,pp. : 1005-1016

Taylor & Francis Ltd

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An integrated optical method for measuring the thickness and refractive index of birefringent thin films

By Caliendo C.   Verona E.   Saggio G.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 255-259

Elsevier

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A method for determining thickness and optical constants of absorbing thin films

By Pekker D.   Pekker L.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 203-209

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