Transmission electron microscopy study of Si -doped GaAs/AlGaAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures

Author： Molina S.I.   Walther T.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.307, Iss.1, 1997-10, pp. : 6-9

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