Influence of annealing on the ferroelectric properties of Pt/Pb(Zr,Ti)O 3 /Pt thin film capacitors

Author: Lee E.G.   Park J.S.   Lee J.K.   Lee J.G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.310, Iss.1, 1997-11, pp. : 327-331

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Abstract