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Author: Ruby C. Fusy J. Alnot M. Genin J.-M. Ehrhardt J.-J.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.311, Iss.1, 1997-12, pp. : 44-50
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Electrical and structural properties of copper films annealed on Si(111)
By Bruggemann M. Masten A. Wiszmann P.
Thin Solid Films, Vol. 406, Iss. 1, 2002-03 ,pp. :