Incorporation and luminescence properties of Er 2 O 3 and ErF 3 doped Si layers grown by molecular beam epitaxy

Author： Ni W.-X.   Joelsson K.B.   Du C.-X.   Pozina G.   Buyanova I.A.   Chena W.M.   Hansson G.V.   Monemar B.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.321, Iss.1, 1998-05, pp. : 223-227

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