Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films

Author: Kucrkova A.   Navratil K.   Zemek J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.323, Iss.1, 1998-06, pp. : 53-58

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Abstract