Surface observation of Mo nanocrystals deposited on Si (111) thin films by a newly developed ultrahigh vacuum field-emission transmission electron microscope

By Tanaka M.   Furuya K.   Takeguchi M.   Honda T.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 110-114

Elsevier

Access to resources Recommend Favorite

Oxidation of zinc particles vacuum-deposited in a high-resolution transmission electron microscope

By Shiojiri M.   Isshiki T.   Ohta M.   Nishio K.  

Thin Solid Films, Vol. 271, Iss. 1, 1995-12 ,pp. : 84-87

Elsevier

Access to resources Recommend Favorite

Observation of Damaged Layers in 4H-SiC Substrates by Mirror Projection Electron Microscope

By  

Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. : 285-288

Trans Tech Publications

Access to resources Recommend Favorite

In situ transmission electron microscope observations of misfit strain relaxation and coalescence stages of Si 1-x Ge x on Si(001)

By Hiroyama Y.   Tamura M.  

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 1-5

Elsevier

Access to resources Recommend Favorite

Direct observation of surface sublimation and relaxation in CdTe{111} films by high-resolution transmission electron microscopy

By Picu R. C.   Rankin J.   Schwartzman A. F.  

Philosophical Magazine Letters, Vol. 79, Iss. 5, 1999-05 ,pp. : 241-247

Taylor & Francis Ltd

Access to resources Recommend Favorite