Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

Author： Solina D.M.   Cheary R.W.   Swift P.D.   Dligatch S.   McCredie G.M.   Gong B.   Lynch P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.372, Iss.1, 2000-09, pp. : 94-103

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