Characteristics of electron traps in Si-doped Ga 0.51 In 0.49 P and electrical properties of modulation doped GaInP/InGaAs/GaAs heterostructures

Author: Besikci C.   Civan Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.338, Iss.1, 1999-01, pp. : 213-219

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Abstract