Scanning tunneling microscopy operating under a plasma environment

Author： Terashima K.   Taniguchi Y.   Yamaguchi N.   Takamura Y.   Yoshida T.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.345, Iss.1, 1999-05, pp. : 146-150

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