Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques

Author： Kulkarni A.K.   Schulz K.H.   Lim T.S.   Khan M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.345, Iss.2, 1999-05, pp. : 273-277

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