Author： Liu Y. Ren W. Zhang L. Yao X.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.353, Iss.1, 1999-09, pp. : 124-128
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Preparation of SiO 2 thin films using the Cat-CVD method
By Saito K. Uchiyama Y. Abe K.
Thin Solid Films, Vol. 430, Iss. 1, 2003-04 ,pp. :
Access to resources
Recommend
Porous SiO 2 films analyzed by transmission electron microscopy
By Gignac L.M. Parrill T.M. Chandrashekhar G.V.
Thin Solid Films, Vol. 261, Iss. 1, 1995-06 ,pp. :
Growth and Structure of Picene Thin Films on SiO2
By Kurihara R. Hosokai T. Kubozono Y.
Molecular Crystals and Liquid Crystals, Vol. 580, Iss. 1, 2013-09 ,pp. :
Ambient-dried SiO 2 aerogel thin films and their dielectric application
By Yang H.-S. Choi S.-Y. Hyun S.-H. Park C.-G.
Thin Solid Films, Vol. 348, Iss. 1, 1999-07 ,pp. :
SiO 2 electret thin films prepared by various deposition methods
By Minami T. Utsubo T. Yamatani T. Miyata T. Ohbayashi Y.
Thin Solid Films, Vol. 426, Iss. 1, 2003-02 ,pp. :