Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

Author: Li B.   Tao K.   Liu X.   Miao W.   Luo J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.353, Iss.1, 1999-09, pp. : 56-61

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Abstract