Physical vapour deposition growth and transmission electron microscopy characterization of epitaxial thin metal films on single-crystal Si and Ge substrates

By Westmacott K. H.   Hinderberger S.   Dahmen U.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 6, 2001-06 ,pp. : 1547-1578

Taylor & Francis Ltd

Access to resources Recommend Favorite

Raman characterization of epitaxial Cu-In-Se thin films

By Ely J.H.   Ohno T.R.   Furtak T.E.   Nelson A.J.  

Thin Solid Films, Vol. 371, Iss. 1, 2000-08 ,pp. : 36-39

Elsevier

Access to resources Recommend Favorite

Transmission electron microscopy study of epitaxial lanthanum-manganite thin films on SrTiO3

By Han K.   Yu-Zhang K.  

Philosophical Magazine B, Vol. 79, Iss. 6, 1999-06 ,pp. : 897-909

Taylor & Francis Ltd

Access to resources Recommend Favorite

Characterization of SnO 2 films on glass by transmission electron microscopy

By Park G.-S.   Yang G.-M.  

Thin Solid Films, Vol. 365, Iss. 1, 2000-04 ,pp. : 7-11

Elsevier

Access to resources Recommend Favorite

Preparation and characterization of Bi 2 S 3 -PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

By Acharya B.S.   Nayak B.B.   Parhi N.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 47-53

Elsevier

Access to resources Recommend Favorite