Optical characterization of thin films with randomly rough boundaries using the photovoltage method

Author： Pavelka R.   Ohldal I.   Hlavka J.   Franta D.   Sitter H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.366, Iss.1, 2000-05, pp. : 43-50

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