Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn

Author: Bonanni A.   Hingerl K.   Sitter H.   Stifter D.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.367, Iss.1, 2000-05, pp. : 216-219

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract