In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Author： Ebert M. Bell K.A. Yoo S.D. Flock K. Aspnes D.E.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.364, Iss.1, 2000-03, pp. : 22-27

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