Critical dimensions for the formation of interfacial misfit dislocations of In 0.6 Ga 0.4 As islands on GaAs(001)

Author: Tillmann K.   Forster A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.368, Iss.1, 2000-06, pp. : 93-104

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Abstract